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Characterizati
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- Buy it nowCharacterization Methods for Submicron MOSFETs (The Springer International Seri
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eBay item number:152471050351
Item specifics
- Condition
- ISBN
- 9780792396956
- Subject Area
- Electrical Engineering
- Publication Name
- Characterization Methods for Submicron Mosfets
- Publisher
- Springer
- Subject
- Engineering & Technology, Physics
- Publication Year
- 1996
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 235mm
- Item Width
- 155mm
- Item Weight
- 1170g
- Number of Pages
- 232 Pages
About this product
Product Information
The Metal-Oxide Semiconductor Field-Effect Transistor (MOSFET) is a key component in modern microelectronics. During the last decade, device physicists, researchers and engineers have been continuously faced with new elements making the task of MOSFET characterization increasingly crucial, as well as more difficult. The progressive miniaturization of devices has caused several phenomena to emerge and modify the performance of scaled-down MOSFETs. Localized degradation induced by hot carrier injection and Random Telegraph Signal (RTS) noise generated by individual traps are examples. It was thus unavoidable to develop new models and new characterization methods, or at least adapt the existing ones to cope with the special nature of these new phenomena. This study deals with techniques which show high potential for characterization of submicron devices. Focus is placed upon the adaptation of such methods to resolve measurement problems relevant to VLSI devices and new materials, especially Silicon-on-Insulator (SOI). The book was written to provide help to device engineers and researchers to enable them cope with the challenges they face. Without adequate device characterization, new physical phenomena and new types of defects or damage may not be well identified or dealt with, leading to an undoubted obstruction of the device development cycle.
Product Identifiers
Publisher
Springer
ISBN-13
9780792396956
eBay Product ID (ePID)
91408789
Product Key Features
Subject Area
Electrical Engineering
Publication Name
Characterization Methods for Submicron Mosfets
Format
Hardcover
Language
English
Subject
Engineering & Technology, Physics
Publication Year
1996
Type
Textbook
Number of Pages
232 Pages
Dimensions
Item Height
235mm
Item Width
155mm
Volume
352
Item Weight
1170g
Additional Product Features
Series Title
The Springer International Series in Engineering and Computer Science
Editor
Hisham Haddara
Country/Region of Manufacture
Netherlands
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