Introduction to X-Ray Powder Diffractometry, Hardcover by Jenkins, Ron; Snyder
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Introduction to X-Ray Powder Diffractometry
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“No jacket, only reason for this rating. Book is in near perfect conditon”
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A book that has been read, but is in good condition. Minimal damage to the book cover eg. scuff marks, but no holes or tears. If this is a hard cover, the dust jacket may be missing. Binding has minimal wear. The majority of pages are undamaged with some creasing or tearing, and pencil underlining of text, but this is minimal. No highlighting of text, no writing in the margins, and no missing pages. See the seller’s listing for full details and description of any imperfections.
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Located in: San Jose, California, United States
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eBay item number:186036785623
Item specifics
- Condition
- Good
- Seller notes
- “No jacket, only reason for this rating. Book is in near perfect conditon”
- Book Title
- Introduction to X-Ray Powder Diffractometry
- ISBN
- 9780471513391
About this product
Product Identifiers
Publisher
Wiley & Sons, Incorporated, John
ISBN-10
0471513393
ISBN-13
9780471513391
eBay Product ID (ePID)
938400
Product Key Features
Number of Pages
432 Pages
Language
English
Publication Name
Introduction to X-Ray Powder Diffractometry
Publication Year
1996
Subject
Materials Science / General, Physics / Optics & Light, Chemistry / Analytic
Type
Textbook
Subject Area
Technology & Engineering, Science
Series
Chemical Analysis: a Series of Monographs on Analytical Chemistry and Its Applications Ser.
Format
Hardcover
Dimensions
Item Height
1 in
Item Weight
23.6 Oz
Item Length
9 in
Item Width
6 in
Additional Product Features
Edition Number
1
Intended Audience
Scholarly & Professional
LCCN
96-012039
Dewey Edition
21
Series Volume Number
158
Illustrated
Yes
Dewey Decimal
548.8/3
Table Of Content
Characteristics of X-Radiation. The Crystalline State. Diffraction Theory. Sources for the Generation of X-Radiation. Detectors and Detection Electronics. Production of Monochromatic Radiation. Instruments for the Measurement of Powder Patterns. Alignment and Maintenance of Powder Diffractometers. Specimen Preparation. Acquisition of Diffraction Data. Reduction of Data from Automated Powder Diffractometers. Qualitative Analysis. Quantitative Analysis. Appendices. Index.
Synopsis
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: ∗ Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer ∗ A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques ∗ Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis ∗ An accessible presentation appropriate for both students and professionals ∗ More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere., When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere., When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file.
LC Classification Number
QC482.D5J46 1996
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