Picture 1 of 8
Picture 1 of 8
YUSHI Leeb Hardbess Tester Probe Impact Device DC Type for Small Workpieces
US $172.00
ApproximatelyEUR 154.25
Condition:
New
A brand-new, unused, unopened and undamaged item in original retail packaging (where packaging is applicable). If the item comes direct from a manufacturer, it may be delivered in non-retail packaging, such as a plain or unprinted box or plastic bag. See the seller's listing for full details.
5 available
Postage:
Free SpeedPAK Standard.
Located in: Shenyang, China
Delivery:
Estimated between Fri, 4 Oct and Fri, 11 Oct to 43230
Returns:
60 days return. Buyer pays for return postage.
Payments:
Shop with confidence
Seller assumes all responsibility for this listing.
eBay item number:226134368522
Item specifics
- Condition
- Brand
- YUSHI
- Gage Type
- Leeb hardness tester probe
- Type
- Hardness
- Model
- DC Type
- UPC
- 700828572283
- MPN
- P-301-0006
- Country/Region of Manufacture
- China
Item description from the seller
Popular categories from this shop
Registered as a business seller
Seller Feedback (479)
- e***e (960)- Feedback left by buyer.Past monthVerified purchaseThanks!
- e***e (960)- Feedback left by buyer.Past monthVerified purchaseThanks!
- 7***a (36)- Feedback left by buyer.Past monthVerified purchaseExactly as described. Much less expensive than domestic models