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YUSHI Leeb Hardbess Tester Probe Impact Device DC Type for Small Workpieces

Condition:
New
5 available
Price:
US $172.00
ApproximatelyEUR 158.58
Postage:
Free SpeedPAK Standard. See detailsfor postage
Located in: Shenyang, China
Delivery:
Estimated between Tue, 4 Jun and Tue, 11 Jun to 43230
Estimated delivery dates - opens in a new window or tab include seller's dispatch time, origin postcode, destination postcode and time of acceptance and will depend on delivery service selected and receipt of cleared paymentcleared payment - opens in a new window or tab. Delivery times may vary, especially during peak periods.
Returns:
60 days return. Buyer pays for return postage. See details- for more information about returns
Payments:
    

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Seller information

Registered as a business seller
Seller assumes all responsibility for this listing.
eBay item number:226134368522
Last updated on 07 May, 2024 16:24:30 BSTView all revisionsView all revisions

Item specifics

Condition
New: A brand-new, unused, unopened and undamaged item in original retail packaging (where packaging ...
Brand
YUSHI
Gage Type
Leeb hardness tester probe
Type
Hardness
Model
DC Type
UPC
700828572283
MPN
P-301-0006
Country/Region of Manufacture
China

Item description from the seller

YUSHI INSTRUMENTS

YUSHI INSTRUMENTS

100% positive Feedback
3.2K items sold
Usually responds within 24 hours

Detailed seller ratings

Average for the last 12 months

Accurate description
4.9
Reasonable postage cost
5.0
Delivery time
5.0
Communication
5.0
Registered as a business seller

Seller Feedback (451)

9***9 (63)- Feedback left by buyer.
Past month
Verified purchase
Super!
p***d (462)- Feedback left by buyer.
Past month
Verified purchase
Ok!
p***d (462)- Feedback left by buyer.
Past month
Verified purchase
Great arrangement and business, fast delivery, everything arrived in perfect order, thank you.