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X-Ray Spectrometry in Electron Beam Instruments - 9781461357384

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Item specifics

Condition
New: A new, unread, unused book in perfect condition with no missing or damaged pages. See the ...
Book Title
X-Ray Spectrometry in Electron Beam Instruments
ISBN
9781461357384
Publication Year
2012
Type
Textbook
Format
Paperback
Language
English
Publication Name
X-Ray Spectrometry in Electron Beam Instruments
Item Height
254mm
Author
Joseph Goldstein, Dale E. Newbury, David B. Williams
Publisher
Springer-Verlag New York Inc.
Item Width
178mm
Subject
Engineering & Technology, Chemistry, Science, Biology
Item Weight
751g
Number of Pages
372 Pages

About this product

Product Information

From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.

Product Identifiers

Publisher
Springer-Verlag New York Inc.
ISBN-13
9781461357384
eBay Product ID (ePID)
176685492

Product Key Features

Author
Joseph Goldstein, Dale E. Newbury, David B. Williams
Publication Name
X-Ray Spectrometry in Electron Beam Instruments
Format
Paperback
Language
English
Subject
Engineering & Technology, Chemistry, Science, Biology
Publication Year
2012
Type
Textbook
Number of Pages
372 Pages

Dimensions

Item Height
254mm
Item Width
178mm
Item Weight
751g

Additional Product Features

Country/Region of Manufacture
United States
Editor
David B. Williams, Joseph Goldstein, Dale E. Newbury

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BOOKS ETC LIMITED
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