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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Mater
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- Buy it nowLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Mater
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Located in: Calgary, Alberta, Canada
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eBay item number:364819646214
Item specifics
- Condition
- ISBN-13
- 9783319998244
- Type
- NA
- Publication Name
- NA
- ISBN
- 9783319998244
- Publication Year
- 2019
- Format
- Hardcover
- Language
- English
- Book Title
- Lock-In Thermography : Basics and Use for Evaluating Electronic Devices and Materials
- Item Length
- 9.3in
- Publisher
- Springer International Publishing A&G
- Genre
- Technology & Engineering, Science
- Topic
- Materials Science / General, Lasers & Photonics, Physics / Optics & Light, Electronics / Semiconductors, Remote Sensing & Geographic Information Systems, Electronics / General
- Item Width
- 6.1in
- Item Weight
- 24.1 Oz
- Number of Pages
- Xxi, 321 Pages
About this product
Product Information
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Product Identifiers
Publisher
Springer International Publishing A&G
ISBN-10
3319998242
ISBN-13
9783319998244
eBay Product ID (ePID)
5038415110
Product Key Features
Book Title
Lock-In Thermography : Basics and Use for Evaluating Electronic Devices and Materials
Format
Hardcover
Language
English
Topic
Materials Science / General, Lasers & Photonics, Physics / Optics & Light, Electronics / Semiconductors, Remote Sensing & Geographic Information Systems, Electronics / General
Publication Year
2019
Genre
Technology & Engineering, Science
Number of Pages
Xxi, 321 Pages
Dimensions
Item Length
9.3in
Item Width
6.1in
Item Weight
24.1 Oz
Additional Product Features
Series Volume Number
10
Number of Volumes
1 Vol.
Lc Classification Number
Qc685-689.55
Edition Number
3
Table of Content
Introduction.- Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.
Copyright Date
2018
Dewey Decimal
621.381548
Series
Springer Series in Advanced Microelectronics Ser.
Dewey Edition
22
Illustrated
Yes
Item description from the seller
Business seller information
Premier Books LLC
David Taylor
26C Trolley Sq
19806-3356 Wilmington, DE
United States
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eBay item number:364819646214
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