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Rare Earth Oxide Thin Films: Growth, Characterizati
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- Buy it nowRare Earth Oxide Thin Films: Growth, Characterization, and Applications by Marco
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Item specifics
- Condition
- ISBN-13
- 9783642071461
- Book Title
- Rare Earth Oxide Thin Films
- ISBN
- 9783642071461
- Subject Area
- Technology & Engineering, Science
- Publication Name
- Rare Earth Oxide Thin Films : Growth, Characterization, and Applications
- Item Length
- 9.3 in
- Publisher
- Springer Berlin / Heidelberg
- Subject
- Materials Science / Thin Films, Surfaces & Interfaces, Materials Science / Electronic Materials, Physics / General, Chemistry / Inorganic
- Publication Year
- 2010
- Series
- Topics in Applied Physics Ser.
- Type
- Textbook
- Format
- Trade Paperback
- Language
- English
- Item Width
- 6.1 in
- Item Weight
- 23.8 Oz
- Number of Pages
- Xvi, 427 Pages
About this product
Product Information
Introduction.- ALD, MOCVD, and MBE deposition of rare earth oxides. - Requirements of precursor for MOCVD and ALD of rare earth oxides.- Models for ALD and MOCVD growth of rare earth oxides.- Growth of oxides with complex stoichiometry by ALD, e.g. La1-xCaxMnO3.- Fabrication and characterization of rare earth scandate thin films prepared by pulsed laser deposition.- Film and interface layer composition of rare earth (Lu, Yb) oxides deposited by ALD.- Local atomic environment of high-k oxides on silicon probed by X-ray absorption spectroscopy, and advanced transmission electron microscopy techniques (TEM-EELS).- Strain-relief at internal dielectric interfaces in high-k gate stacks with transition metal and rare earth atom oxide dielectrics.- Electrical characterization of rare earth oxides grown by ALD.- Dielectric properties of rare-earth oxides: general trends from theory.- Charge traps in high-k dielectrics: ab initio study of defects in Pr-based materials.- Experimental determination of the band offset of rare earth oxides on various semiconductors.- Band edge electronic structure, and band offsets of transition metal/rare earth oxide dielectrics.- Rare earth oxides in microelectronics.- Requirements of oxides as gate dielectrics for CMOS devices, and ultimate scaling.- The magneto-electric properties of RMnO compounds.- Sesquioxides as host materials for rare-earth-doped bulk lasers and active waveguides.
Product Identifiers
Publisher
Springer Berlin / Heidelberg
ISBN-10
3642071465
ISBN-13
9783642071461
eBay Product ID (ePID)
112853618
Product Key Features
Publication Name
Rare Earth Oxide Thin Films : Growth, Characterization, and Applications
Format
Trade Paperback
Language
English
Subject
Materials Science / Thin Films, Surfaces & Interfaces, Materials Science / Electronic Materials, Physics / General, Chemistry / Inorganic
Publication Year
2010
Series
Topics in Applied Physics Ser.
Type
Textbook
Subject Area
Technology & Engineering, Science
Number of Pages
Xvi, 427 Pages
Dimensions
Item Length
9.3 in
Item Width
6.1 in
Item Weight
23.8 Oz
Additional Product Features
Intended Audience
Scholarly & Professional
Series Volume Number
106
Number of Volumes
1 Vol.
Lc Classification Number
Q1-390
Table of Content
Introduction.- ALD, MOCVD, and MBE deposition of rare earth oxides. - Requirements of precursor for MOCVD and ALD of rare earth oxides.- Models for ALD and MOCVD growth of rare earth oxides.- Growth of oxides with complex stoichiometry by ALD, e.g. La1-xCaxMnO3.- Fabrication and characterization of rare earth scandate thin films prepared by pulsed laser deposition.- Film and interface layer composition of rare earth (Lu, Yb) oxides deposited by ALD.- Local atomic environment of high-k oxides on silicon probed by X-ray absorption spectroscopy, and advanced transmission electron microscopy techniques (TEM-EELS).- Strain-relief at internal dielectric interfaces in high-k gate stacks with transition metal and rare earth atom oxide dielectrics.- Electrical characterization of rare earth oxides grown by ALD.- Dielectric properties of rare-earth oxides: general trends from theory.- Charge traps in high-k dielectrics: ab initio study of defects in Pr-based materials.- Experimental determination of the band offset of rare earth oxides on various semiconductors.- Band edge electronic structure, and band offsets of transition metal/rare earth oxide dielectrics.- Rare earth oxides in microelectronics.- Requirements of oxides as gate dielectrics for CMOS devices, and ultimate scaling.- The magneto-electric properties of RMnO compounds.- Sesquioxides as host materials for rare-earth-doped bulk lasers and active waveguides.
Copyright Date
2007
Dewey Decimal
621.3815/2
Dewey Edition
22
Illustrated
Yes
Item description from the seller
Business seller information
Premier Books LLC
David Taylor
26C Trolley Sq
19806-3356 Wilmington, DE
United States
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eBay item number:395157061540
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